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KMID : 0381920060360020041
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Korean Journal of Microscopy
2006 Volume.36 No. 2 p.41 ~ p.46
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Atomic Structure Analysis of A ZnO/Pd Interface by Atomic Resolution HVTEM
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Hiromitsu Saito
Hideki Ichinose
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Abstract
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Interfacial atomic structure (chemical structure) of a Pd/ZnO hetero junction was investigated by atomic resolution high voltage transmission electron microscopy (ARHVTEM). A misfit dislocation did not work as a stress accommodation mechanism in the ZnO (0001)/Pd (111) interface. But the periodic stress localization occurred in the ZnO (10m1
0)/(200) interface. The periodicity of the local strain coincided with that of misfit dislocation. Atomic structure image of the ARHVTEM showed that an atomic arrangement across the interface was in the order of O-Zn-Pd. It was shown that mechanical weakness of the ZnO (0001)/Pd (111) interface against cyclic heating is attributable to the absence of the periodic stress localization of the misfit dislocation.
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KEYWORD
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Atomic resolution, HVTEM, Misfit dislocation
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